Error-proofing Operations – Real-time Inline Metrology System

Background
This semiconductor manufacturer was scrapping too many wafers late in their recording head production process. Catalyst SDP was used to enable an inline metrology step with the primary purpose of identifying indicators of scrap at a step where rework was still an option, therefore reducing scrap costs dramatically.

Results
Scrap was reduced by over 50% within 6 months after the Catalyst-based inline metrology system was installed. This reduced scrap equated to over $3.7 million annually (or more than $10,000 per day).